Prioritised review queue
Scrub through a very large backlog with server-side filters, keyset paging and keyboard navigation. The worst wafers surface first.
Access-controlled review platform
Moore Semiconductor is a wafer map review console for fabs. It brings a prioritised queue, interactive die maps, automatic pattern detection and an auditable disposition trail into one secure workspace.
The review platform requires an account. Fab access is assigned by your administrator.
Platform
Scrub through a very large backlog with server-side filters, keyset paging and keyboard navigation. The worst wafers surface first.
Switch between bin, parametric, defect and overlay views in a single viewer, with legends versioned per fab and product.
Edge ring, centre cluster, donut, scratch and random patterns are flagged at ingest and stored, so every reviewer sees the same evidence.
Zone-level yield and trends are aggregated in the database, so dashboards stay fast as the dataset grows.
Trace a pattern back to shared equipment, recipes and lots, then click straight through to the affected wafers.
Pass, rework, hold, scrap or escalate, each with a reason. Every change is written to an append-only history.
Probe files and CSV maps are stored privately and parsed on upload.
Rule-based detectors flag spatial patterns and compute zone yield.
Engineers inspect the map, the flags and the process context.
A reviewer records the decision with a reason code and version check.
Decisions feed evaluation so detection can be measured and improved.
Security
Wafer data is never shown on this page. Sign in to reach the review queue, dashboards and uploads. What you see is limited to the fabs your administrator has assigned to you.
Row-level security restricts every query to your assigned fabs.
Probe files live in private storage and are parsed by authenticated server functions.
Every disposition is versioned and written to a history that cannot be edited.
Sign in to open the queue for your fab.